John Miao
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October 09, 2007 - In collaboration with Margaret Murnane, Henry Kapteyn and colleagues from the University of Colorado at Boulder and LBNL, CNSI member John Miao and his postdoc, Changyong Song, report the first experimental demonstration of tabletop diffraction microscopy by using high harmonic soft-x-ray beams. This work was published in Physical Review Letters and highlighted in a News & Views article in Nature. In the experiment, the soft-x-ray diffraction pattern of a specimen is measured, and then directly inverted to an image based on sophisticated algorithms called oversampling. By avoiding the use of lenses, this imaging technique is aberration free and can in principle achieve the nanometer scale resolution. Furthermore, due to the deeper penetration depth of x-rays than of electrons, this tabletop microscope can image buried structures and provide 3D views. It is anticipated that tabletop soft-x-ray diffraction microscopy will find broad applications in materials science, nanoscience and biology.
Physical Review Letters
Nature News and Views
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